Building the Next Generation of DFT IPs and EDA Solutions — Powered by AI

By SoCTeamup Semiconductors

---

The Complexity of DFT is Rising — So Are We

Modern SoC designs are pushing the boundaries of integration, performance, and testability. As technology nodes shrink and system complexity grows, Design for Test (DFT) becomes not just a requirement—but a core enabler of silicon success.

At SoCTeamup, we are addressing these challenges with a comprehensive DFT IP suite, built to be modular, reusable, and rapidly deployable. But more importantly—we are going beyond traditional methods by embedding AI and automation into the very fabric of our DFT architecture.

The SoCTeamup DFT IP Suite: Current Innovations

1. Automated DFT Insertion IPs

DFT insertion is often the slowest and most manual part of backend SoC prep. Our IPs automate test port creation, scan chain balancing, and controller configuration—reducing turnaround time by up to 10X.

2. Logic BIST & Memory BIST IPs

Plug-and-play BIST modules for high fault coverage in compute blocks and memory arrays. Configurable to target a wide range of fault models and coverage goals.

3. Boundary Scan, Compression/Decompression & Wrappers

IEEE 1149.1-compliant scan infrastructure, wrapper cells, and scan compression IPs built for SoC and IP-level integration.

4. Secure Test Access Logic

Test access controllers that support authentication and encryption—ensuring silicon test security for defense and mission-critical applications.

5. Reusable DFX Libraries

Libraries that embed test hooks, debug infrastructure, and power-aware logic for low-overhead, high-impact DFT reuse.

---

AI-Driven Next Steps: Where We’re Headed

To meet the rising complexity of design and shrinking timelines, SoCTeamup is actively embedding AI and machine learning into its DFT and EDA stack.

1. AI-Powered DFT Planning Assistants

We are building smart agents that can:

• Automatically evaluate SoC hierarchy and test coverage gaps

• Recommend optimal test architectures

• Predict timing/power/test trade-offs in real time

  Goal: Accelerate upfront DFT architecture decisions by reducing human planning cycles.

  ---

  2. ML-Based Fault Coverage Prediction

Using trained models to:

• Estimate coverage bottlenecks before test pattern generation

• Suggest changes in scan structure or BIST configuration

• Rank fault sensitivity for different design regions

  Goal: Proactively enhance testability with predictive insights—not reactive fixes.

  ---

  3. Intelligent IP Tuning & Selection

We are working on an AI-guided IP configuration engine that:

• Matches IP blocks (BIST, wrappers, scan cells) to design needs

• Adapts parameters based on prior silicon data and project specs

• Minimizes overdesign and under-coverage

  Goal: Shorten design closure by selecting “just-right” DFT configurations automatically.

  ---

  4. DFT-aware RTL Assistance (Future Roadmap)

A smart assistant for RTL designers that:

• Flags DFT-inhibiting coding patterns early

• Recommends RTL changes to improve testability

• Integrates directly with version control for CI/CD flows

  Goal: Shift DFT-left with AI guidance from day one of RTL design.

  ---

  Our Philosophy: Intelligence + Integration

  At SoCTeamup, we believe the future of DFT lies not only in IP modularity but in intelligence at every step. From scan insertion to test planning, debug to security, we are transforming DFT from a manual bottleneck into an AI-augmented design accelerator.

  And we’re doing it with the same engineering rigor that’s powered 30+ advanced-node tapeouts.

  ---

  Let’s Collaborate

  Whether you're a fabless startup looking for test-ready IP, a product company aiming to harden your SoCs, or a government lab with mission-critical silicon—we're ready to partner.

  📩 contact@socteamup.com

  🌐 www.socteamup.com